Measurements of surface roughness of polyolefin films by atomic force microscopy.
نویسندگان
چکیده
منابع مشابه
Surface Evaluation of Resin Zein Films Containing Sugar Plasticizers by Permeability and Atomic Force Microscopy Analysis
Zein is one of the best biopolymer for edible film making and sugars are natural plasticizers for biopolymers. In this research, sugars (fructose, galactose and glucose) at three levels (0.5, 0.7, 1 g/g of zein) were used as plasticizers for zein protein films and their water vapor permeability (WVP), oxygen permeability (OP) and atomic force microscopy (AFM) topography were studied. The p...
متن کاملInvestigation of Intraocular Lenses Surface Roughness by Atomic Force Microscopy
The aim of this study was to evaluate the surface roughness of intraocular lenses (IOLs) generated by the manufacturing process and to determine the roughness parameters of 3D surface using atomic force microscopy (AFM). Intraocular lenses commercially available from a single manufacturer: Pharmacia & Upjohn Co. were investigated. Three intraocular lenses, model 911A CeeOn Edge, were analyzed o...
متن کاملsurface evaluation of resin zein films containing sugar plasticizers by permeability and atomic force microscopy analysis
zein is one of the best biopolymer for edible film making and sugars are natural plasticizers for biopolymers. in this research, sugars (fructose, galactose and glucose) at three levels (0.5, 0.7, 1 g/g of zein) were used as plasticizers for zein protein films and their water vapor permeability (wvp), oxygen permeability (op) and atomic force microscopy (afm) topography were studied. the pure z...
متن کاملAdhesion force mapping on wood by atomic force microscopy: influence of surface roughness and tip geometry
This study attempts to address the interpretation of atomic force microscopy (AFM) adhesion force measurements conducted on the heterogeneous rough surface of wood and natural fibre materials. The influences of wood surface roughness, tip geometry and wear on the adhesion force distribution are examined by cyclic measurements conducted on wood surface under dry inert conditions. It was found th...
متن کاملAtomic Force Microscopy and Direct Surface Force Measurements
The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic) topographical analysis, applicable to both conducting and nonconducting surfaces. The basic imaging principle is very simple: a sample attached to a piezoelectric positioner is rastered beneath a sharp tip attached to a sensitive cantilever spring. Undulations in the surface lead to deflection o...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: BUNSEKI KAGAKU
سال: 1996
ISSN: 0525-1931
DOI: 10.2116/bunsekikagaku.45.347